{"product_id":"vlsi-test-principles-and-architectures-design-for-testability-morgan-kaufmann-series-in-systems-on-silicon-hardcover","title":"VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))","description":"Good - .  In good condition.","brand":"Your Book Basket","offers":[{"title":"Default Title","offer_id":52633721962770,"sku":"42701","price":76.46,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0939\/7590\/4530\/files\/61OVePPzs4L.jpg?v=1787433992","url":"https:\/\/yourbookbasket.com\/products\/vlsi-test-principles-and-architectures-design-for-testability-morgan-kaufmann-series-in-systems-on-silicon-hardcover","provider":"Your Book Basket","version":"1.0","type":"link"}