• VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
1 1

Your Book Basket

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

$76.46 USD
$76.46 USD
Sale Sold out
Shipping calculated at checkout.
Good - . In good condition.
View full details
Author

Wang, Laung-Terng; Wen, Xiaoqing; Wu, Cheng-Wen; Abdel-Hafez, Khader S.; Jone, Wen-Ben; Min, Yinghua; Mak, T.M.; Keller, Brion; Lee, Kuen-Jong; Li, Mike Peng; Li, Xiaowei; Kapur, Rohit; Li, James C.-M.; Nadeau-Dostie, Benoit; Nourani, Mehrdad; Rajski, Janusz; Bhattacharya, Soumendu; Stroud, Charles; Volkerink, Erik H.; Walker, Duncan M. (Hank); Wu, Shianling; Touba, Nur A.; Chen, Xinghao; Chatterjee, Abhijit; Eklow, William; Cheng, Kwang-Ting (Tim); Hsiao, Michael S.; Huang, Jiun-Lang; Huang, Shi-Yu

Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Book Details

Publisher: Morgan Kaufmann

ISBN-13: 9780123705976

ISBN-10: 0123705975